Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching :
Kaupp, G.
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp - Berlin Springer-Verlag, 2006. - 292 p. ill. - Nanoscience and technology, 1434-4904 .
Includes bibliographical references and index.
3540284052 9783540284055
Science
Atomic force microscopy.
Near-field microscopy.
Nanoscratching
502.82 / KAU-A
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp - Berlin Springer-Verlag, 2006. - 292 p. ill. - Nanoscience and technology, 1434-4904 .
Includes bibliographical references and index.
3540284052 9783540284055
Science
Atomic force microscopy.
Near-field microscopy.
Nanoscratching
502.82 / KAU-A