Defect Complexes in Semiconductor Structures (Record no. 12334)
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fixed length control field | 03610nam a22004815i 4500 |
001 - CONTROL NUMBER | |
control field | 978-3-540-39456-3 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | DE-He213 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20190213151923.0 |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr nn 008mamaa |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 121227s1983 gw | s |||| 0|eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9783540394563 |
-- | 978-3-540-39456-3 |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1007/3-540-11986-8 |
Source of number or code | doi |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QC173.45-173.458 |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | PHF |
Source | bicssc |
072 #7 - SUBJECT CATEGORY CODE | |
Subject category code | SCI077000 |
Source | bisacsh |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 530.41 |
Edition number | 23 |
245 10 - TITLE STATEMENT | |
Title | Defect Complexes in Semiconductor Structures |
Medium | [electronic resource] : |
Remainder of title | Proceedings of the International School Held in Mátrafüred, Hungary September 13–17, 1982 / |
Statement of responsibility, etc | edited by J. Giber, F. Beleznay, I. C. Szép, J. László. |
264 #1 - | |
-- | Berlin, Heidelberg : |
-- | Springer Berlin Heidelberg, |
-- | 1983. |
300 ## - PHYSICAL DESCRIPTION | |
Extent | VI, 311 p. 81 illus. |
Other physical details | online resource. |
336 ## - | |
-- | text |
-- | txt |
-- | rdacontent |
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-- | computer |
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-- | rdamedia |
338 ## - | |
-- | online resource |
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347 ## - | |
-- | text file |
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490 1# - SERIES STATEMENT | |
Series statement | Lecture Notes in Physics, |
International Standard Serial Number | 0075-8450 ; |
Volume number/sequential designation | 175 |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | A technologist's view on defects -- Characterization of impurities and defects by electron paramagnetic resonance and related techniques -- Review of the possibilities of electron microscopy in the identification of defect structures -- Electrical and optical measuring techniques for flaw states -- Theory of defect complexes -- Critical comparison of the theoretical models for anomalous large lattice relaxation in III–V compounds -- Vacancy related structure defects in SiO2 — Cyclic cluster calculations compared with experimental results -- A new model for the Si-A center -- Defect complexing in iron-doped silicon -- Photoluminescence of defect complexes in silicon -- Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon -- Oxygen precipitation and the generation of secondary defects in oxygen-rich silicon -- Electrical and optical properties of oxygen-related donors in silicon formed at temperatures from 600 to 850 °c -- On the field dependence of capture and emission processes at deep centres -- Lattice matched heterolayers -- Compositional transition layers in heterostructure -- Defect complexes in III–V compounds -- Low frequency current oscillations due to electron retrapping by the AsGa antisite defect in GaAs -- Main electron traps in gaas: Aggregates of antisite defects -- Defect reactions in gap caused by zinc diffusion -- Nonstatistical defect surroundings in mixed crystals — the selfactivated luminescence centre in ZnSxSe1-x -- Structure and properties of the Si-SiO2 interregion -- Radiation defects of the semiconductor-insulator interface -- Analysis of Si/SiO2 interface defects by the method of term spectroscopy -- Theoretical aspects of laser annealing -- Radiation methods for creation of heterostructures on silicon -- Ion beam gettering in GaP -- Panel discussion -- Mechanical stress induced defect creation in GaP. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Condensed matter. |
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Physics. |
650 24 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Condensed Matter Physics. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Giber, J. |
Relator term | editor. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Beleznay, F. |
Relator term | editor. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Szép, I. C. |
Relator term | editor. |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | László, J. |
Relator term | editor. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | SpringerLink (Online service) |
773 0# - HOST ITEM ENTRY | |
Title | Springer eBooks |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Display text | Printed edition: |
International Standard Book Number | 9783540119869 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | Lecture Notes in Physics, |
-- | 0075-8450 ; |
Volume number/sequential designation | 175 |
856 40 - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | http://dx.doi.org/10.1007/3-540-11986-8 |
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