Novel Application of Anomalous (Resonance) X-ray Scattering for Structural Characterization of Disordered Materials [electronic resource] / edited by Yoshio Waseda.
Material type: TextSeries: Lecture Notes in Physics ; 204Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 1984Description: VI, 186 p. online resourceContent type:- text
- computer
- online resource
- 9783540389101
- 548 23
- QD901-999
A brief background of the present requirement for structural characterization of disordered materials -- Fundamental relationships between rdf and scattering intensity -- Definition of partial structure factors and compositional short range order (CSRO) -- Experimental determination of partial structural functions -- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials -- Theoretical aspects on the anomalous dispersion factors of x-rays -- Experimental determination of the anomalous dispersion factors -- Selected examples of structural determination using anomalous (resonance) x-ray scattering -- Relative merits of anomalous x-ray scattering and its future prospects.
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