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Scanning probe microscopy: atomic scale engineering by forces and currents/ A. Foster by
  • Foster, A
  • Hofer, Werner
Series: Nanoscience and technology
Material type: Text Text
Language: Eng
Publication details: New York: Springer Science+Business, c2006
Online access:
Availability: Items available for loan: IISER Central Library (1)Call number: 502.82 FOS-S.
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Imaging, Spectroscopy and Device fabrication using Scanning Probes / Lalit Yadav by
  • Yadav, Lalit [MS13065]
  • Supervisor name - Dr. Goutam Sheet
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: Eng.
Publication details: Iiser Mohali : Department of Physical Sciences, April 2018
Dissertation note:
Online access:
Availability: Items available for reference: IISER Central Library: Not For Loan (1).
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