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_a10.1007/3-540-46614-2 _2doi |
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050 | 4 | _aTA418.9.N35 | |
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_aTBN _2bicssc |
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_aTEC027000 _2bisacsh |
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_a620.115 _223 |
245 | 1 | 0 |
_aLight Scattering from Microstructures _h[electronic resource] : _bLectures of the Summer School of Laredo, University of Cantabria, Held at Laredo, Spain, Sept. 11–13, 1998 / _cedited by Fernando Moreno, Francisco González. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2000. |
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300 |
_aXII, 300 p. 121 illus. _bonline resource. |
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336 |
_atext _btxt _2rdacontent |
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_acomputer _bc _2rdamedia |
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_aonline resource _bcr _2rdacarrier |
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_atext file _bPDF _2rda |
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490 | 1 |
_aLecture Notes in Physics, _x0075-8450 ; _v534 |
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505 | 0 | _aLight scattering by submicron spherical particles on semiconductor surfaces -- to Light Scattering from Microstructures -- Theory -- Heaviside Operational Calculus and Electromagnetic Image Theory -- Mathematical Methods for Data Inversion -- Mueller Matrices -- Scattering by Particles on Substrates. Numerical Methods -- Light Scattering from a Sphere Near a Plane Interface -- Electromagnetic Scattering by Cylindrical Objects on Generic Planar Substrates: Cylindrical-Wave Approach -- T-Matrix Method for Light Scattering from a Particle on or Near an Infinite Surface -- Scattering of Polarized Light -- Properties of a Polarized Light-Beam Multiply Scattered by a Rayleigh Medium -- Polarization and Depolarization of Light -- Statistics of the Scattered Light -- Polarisation Fluctuations in Light Scattered by Small Particles -- Intensity Statistics of the Light Scattered by Particles on Surfaces -- Applications -- Microstructures in Rough Metal Surfaces: Electromagnetic Mechanism in Surface-Enhanced Raman Spectroscopy -- Light Scattering by Particles and Defects on Surfaces: Semiconductor Wafer Inspection -- From Scattering to Waveguiding: Photonic Crystal Fibres -- The Angular Distribution of Light Emitted by Sonoluminescent Bubbles -- Light Scattering by Regular Particles on Flat Substrates. | |
520 | _aWith a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others. | ||
650 | 0 | _aNanotechnology. | |
650 | 0 | _aPhysics. | |
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_aNanotechnology. _0http://scigraph.springernature.com/things/product-market-codes/Z14000 |
650 | 2 | 4 |
_aSolid State Physics. _0http://scigraph.springernature.com/things/product-market-codes/P25013 |
650 | 2 | 4 |
_aSpectroscopy and Microscopy. _0http://scigraph.springernature.com/things/product-market-codes/P31090 |
650 | 2 | 4 |
_aPhysics, general. _0http://scigraph.springernature.com/things/product-market-codes/P00002 |
700 | 1 |
_aMoreno, Fernando. _eeditor. _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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700 | 1 |
_aGonzález, Francisco. _eeditor. _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783662142745 |
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_iPrinted edition: _z9783662142738 |
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_iPrinted edition: _z9783540669371 |
830 | 0 |
_aLecture Notes in Physics, _x0075-8450 ; _v534 |
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