000 06108nam a22005775i 4500
001 978-3-540-45850-0
003 DE-He213
005 20190213151034.0
007 cr nn 008mamaa
008 100715s2002 gw | s |||| 0|eng d
020 _a9783540458500
_9978-3-540-45850-0
024 7 _a10.1007/3-540-45850-6
_2doi
050 4 _aT174.7
050 4 _aTA418.9.N35
072 7 _aTBN
_2bicssc
072 7 _aTEC027000
_2bisacsh
072 7 _aTBN
_2thema
082 0 4 _a620.115
_223
245 1 0 _aNanoscale Spectroscopy and Its Applications to Semiconductor Research
_h[electronic resource] /
_cedited by Yoshio Watanabe, Giancarlo Salviati, Stefan Heun, Naoki Yamamoto.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2002.
300 _aXV, 308 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aLecture Notes in Physics,
_x0075-8450 ;
_v588
505 0 _aSpectro-microscopy by TEM-SEM -- Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy -- Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers -- Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies -- Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL -- Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques -- Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction -- Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics -- Long-Term Oxidation Behaviour of Lead Sulfide Surfaces -- Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures -- Surface Imaging Using Electrons Excited by Metastable-Atom Impacts -- Application of Photoemission Electron Microscopy to Magnetic Domain Imaging -- Photoelectron Spectroscopy with a Photoemission Electron Microscope -- X-ray Photoemission and Low-Energy Electron Microscope -- Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics -- Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures -- Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy -- Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip -- Electron-Beam-Induced Decomposition of SiO2 Overlay on Si in STM Nanolithography -- Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy -- Growth and Characterization of Ge Nanostructures on Si(111) -- Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy -- Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies -- Electronic Properties of Polycrystalline and Amorphous WO3 Investigated with Scanning Tunnelling Spectroscopy -- Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures -- Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures.
520 _aFabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher,taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.
650 0 _aNanotechnology.
650 0 _aOptical materials.
650 1 4 _aNanotechnology.
_0http://scigraph.springernature.com/things/product-market-codes/Z14000
650 2 4 _aOptical and Electronic Materials.
_0http://scigraph.springernature.com/things/product-market-codes/Z12000
650 2 4 _aSolid State Physics.
_0http://scigraph.springernature.com/things/product-market-codes/P25013
650 2 4 _aSpectroscopy and Microscopy.
_0http://scigraph.springernature.com/things/product-market-codes/P31090
650 2 4 _aMeasurement Science and Instrumentation.
_0http://scigraph.springernature.com/things/product-market-codes/P31040
700 1 _aWatanabe, Yoshio.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aSalviati, Giancarlo.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aHeun, Stefan.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
700 1 _aYamamoto, Naoki.
_eeditor.
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783662143728
776 0 8 _iPrinted edition:
_z9783540433125
776 0 8 _iPrinted edition:
_z9783662143711
830 0 _aLecture Notes in Physics,
_x0075-8450 ;
_v588
856 4 0 _uhttps://doi.org/10.1007/3-540-45850-6
912 _aZDB-2-PHA
912 _aZDB-2-LNP
912 _aZDB-2-BAE
999 _c9301
_d9301