Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces G. Kaupp
Material type: TextLanguage: Eng Series: Nanoscience and technologyPublication details: Berlin Springer-Verlag, 2006.Description: 292 p. illISBN:- 3540284052
- 9783540284055
- 502.82 22 KAU-A
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Books | IISER Central Library Second Floor- Left Wing | 502.82 KAU-A (Browse shelf(Opens below)) | Available | 0001843 |
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502.82 HAW-S vol-I Science of microscopy : | 502.82 HAW-S vol-II Science of microscopy : | 502.82 HAW-S vol-ii Science of microscopy : | 502.82 KAU-A Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : | 502.825 FLE-S Scanning and transmission electron microscopy : | 502.825 GOL-S Scanning Electron Microscopy and X-Ray Microanalysis | 502.825 MUL-C Introduction to confocal fluoresence microscopy/ |
Includes bibliographical references and index.
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